Methods and systems for lithography process control

ABSTRACT

Methods and systems for evaluating and controlling a lithography process are provided. For example, a method for reducing within wafer variation of a critical metric of a lithography process may include measuring at least one property of a resist disposed upon a wafer during the lithography process. A critical metric of a lithography process may include, but may not be limited to, a critical dimension of a feature formed during the lithography process. The method may also include altering at least one parameter of a process module configured to perform a step of the lithography process to reduce within wafer variation of the critical metric. The parameter of the process module may be altered in response to at least the one measured property of the resist.

PRIORITY CLAIM

This application is a continuation of and claims priority to U.S. patentapplication Ser. No. 09/849,622 filed May 4, 2001, now U.S. Pat. No.6,689,519 which claims priority to U.S. Provisional Application No.60/202,372 entitled “Method and System for Lithography Process Control,”filed May 4, 2000.

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention generally relates to systems and methods for evaluatingand controlling semiconductor fabrication processes. Certain embodimentsrelate to systems and methods for evaluating and/or controlling alithography process by measuring a property of a resist and controllinga process step involved in the lithography process.

2. Description of the Related Art

Semiconductor fabrication processes typically involve a number oflithography steps to form various features and multiple levels of asemiconductor device. Lithography involves transferring a pattern to aresist formed on a semiconductor substrate, which may be commonlyreferred to as a wafer. A reticle, or a mask, may be disposed above theresist and may have substantially transparent regions and substantiallyopaque regions configured in a pattern that may transferred to theresist. As such, substantially opaque regions of the reticle may protectunderlying regions of the resist from exposure to an energy source. Theresist may, therefore, be patterned by selectively exposing regions ofthe resist to an energy source such as ultraviolet light, a beam ofelectrons, or an x-ray source. The patterned resist may then be used tomask underlying layers in subsequent semiconductor fabrication processessuch as ion implantation and etch. Therefore, a resist may substantiallyinhibit an underlying layer such as a dielectric material or thesemiconductor substrate from implantation of ions or removal by etch.

As the features sizes of semiconductor devices continue to shrink, theminimum feature size which may be successfully fabricated may often belimited by performance characteristics of a lithography process.Examples of performance characteristics of a lithography processinclude, but are not limited to, resolution capability, across chiplinewidth variations, and across wafer linewidth variations. In opticallithography, performance characteristics such as resolution capabilityof the lithography process may often be limited by the quality of theresist application, the performance of the resist, the exposure tool,and the wavelength of light which is used to expose the resist. Theability to resolve a minimum feature size, however, may also be stronglydependent on other critical parameters of the lithography process suchas a temperature of a post exposure bake process or an exposure dose ofan exposure process. As such, controlling the critical parameters oflithography processes is becoming increasingly important to thesuccessful fabrication of semiconductor devices.

One strategy to improve the performance characteristics of a lithographyprocess may involve controlling and reducing variations in criticalparameters of the lithography process. For example, one criticalparameter in a lithography process may be the post exposure baketemperature. In particular, a chemical reaction in an exposed portion ofa chemically amplified resist may be driven and controlled by heatingthe resist subsequent to the exposure process. Such a resist mayinclude, but may not be limited to, a resin and a photo-acid generatingcompound. The temperature of a post exposure bake process may drivegeneration and diffusion of a photo-generated acid in the resist thatcauses deblocking of the resin. Deblocking of the resin maysubstantially alter the solubility of the resist such that it may beremoved by exposure to an aqueous developer solution in a subsequentdeveloping process. As such, temperature-controlled diffusion in theexposed resist may affect physical dimensions of remaining resist, orresolved features. Furthermore, variations in temperature across a bakeplate of a post exposure bake process module may cause variations in thedimensions of the features at various positions on a wafer. Therefore,the resolution capability of a lithography process may be improved byreducing temperature variations across the bake plate of a post exposurebake process module.

There are several disadvantages, however, in using currently availablemethods to improve the resolution capability of lithography processes.For example, currently available methods may not account for degradationin the uniformity of a critical parameter over time. For a post exposurebake module, thermal relaxation of heating elements, contamination, orother performance variations may adversely affect the resolutioncapability of a lithography process to various degrees over time. Assuch, monitoring and controlling time-dependent variations in thecritical parameters may maintain and improve the performancecharacteristics of a lithography process. In addition, integratedcontrol mechanisms that may currently be used to monitor variations inthe temperature of the post exposure bake module may control and alterthe process at the wafer level. Therefore, all positions, or fields, onthe wafer are affected equally and improvements are made for an averageperformance across the wafer. In this manner, systematic variations inthe resolution capability from field to field across a wafer may not bemonitored or altered, which may have an adverse affect on the overallperformance characteristics of a lithography process.

Accordingly, it may be advantageous to develop a method and a system toevaluate and control a lithography process such that within wafervariability of critical dimensions of features formed by a lithographyprocess may be reduced.

SUMMARY OF THE INVENTION

An embodiment of the invention relates to a method for reducing withinwafer (“WIW”) variation of a critical metric of a lithography process. Acritical metric of a lithography process may include, but is not limitedto, a critical dimension of features formed during the lithographyprocess and overlay. Critical dimensions of features formed during alithography process may include, for example, a width, a height, and asidewall profile of the features. Overlay generally refers to a lateralposition of a feature on one level of a wafer with respect to a lateralposition of a feature on another level of the wafer. The lithographyprocess may include optical lithography, e-beam lithography, or x-raylithography.

The method may include measuring at least one property of a resistdisposed upon a wafer during the lithography process. For example, themethod may include measuring at least the one property of the resist atvarious locations across the wafer. In addition, the method may includemeasuring at least the one property of the resist between steps of thelithography process or during a step of the lithography process.Furthermore, the method may include measuring at least one property of aresist disposed upon at least two wafers during the lithography process.At least the one property may include, but may not be limited to, athickness, an index of refraction, an extinction coefficient, alinewidth of a latent image, a height of a latent image, a width of afeature, a height of a feature, overlay, or any combination thereof. Alatent image generally refers to an image that may be formed in anexposed resist subsequent to a post exposure bake process.

The method may further include altering at least one parameter of aprocess module, configured to perform a step of the lithography process,in response to at least the one measured property of the resist. In thismanner, within wafer variation of a critical metric may be reduced. Theprocess module may include, but may not be limited to, a surfacepreparation module, a coat module, a bake module, an expose module, or adevelop module. In addition, if at least one property of a resistdisposed upon at least two wafers is measured, then the method mayinclude altering at least one parameter of a process module in responseto at least the one measured property of the resist disposed upon atleast the two wafers. At least the one parameter may be altered using afeedback control technique, a feedforward control technique, an in situcontrol technique, or any combination thereof.

Altering at least the one parameter may include processing a firstportion of a wafer with a first set of process conditions during thestep and processing a second portion of the wafer with a second set ofprocess conditions during the step. For example, if at least the onemeasured property includes thickness variation across the wafer, then aportion of the wafer coated with a thicker resist may be exposed with ahigher exposure dose than a portion of the wafer coated with a thinnerresist in response to the measured thickness variation. In an,additional example, a portion of a wafer coated with a thicker resistmay be heated to a higher temperature during a post exposure bakeprocess than a portion of the wafer coated with a thinner resist inresponse to a measured thickness variation. In this manner, processconditions of a lithography process step may vary across a wafer suchthat a critical metric of the lithography process may be substantiallyuniform across the wafer despite variations in resist properties.

An additional embodiment relates to a system configured to reduce withinwafer variation of a critical metric of a lithography process. Thecritical metric may include a critical dimension of a feature formed bythe lithography process or any of the critical metrics as describedabove. The system may include at least one measurement device. At leastthe one measurement device may be configured to measure at least oneproperty of a resist disposed upon a wafer during the lithographyprocess. For example, at least the one measurement device may beconfigured to measure at least the one property of the resist at variouslocations across the wafer. In addition, at least the one measurementdevice may be configured to measure at least the one property of theresist between steps of the lithography process. Alternatively, at leastthe one measurement device may be configured to measure at least the oneproperty of the resist during a step of the lithography process. Forexample, a measurement device may be integrated into a lithographycluster tool as described herein. Because a property of the resist maybe measured during a lithography process, a method as described hereinmay have a quicker turn around time than conventional lithographyprocess control methods. Therefore, a method as described herein mayyield a larger number of semiconductor devices having relatively highperformance bin characteristics. At least the one property may includeany of the properties as described herein.

The system may also include a process module configured to perform astep of the lithography process. The process module may include, forexample, a surface preparation module, a coat module, a bake module, anexpose module, or a develop module. At least one parameter of theprocess module may be altered in response to at least the one measuredproperty such that the within wafer variation of the critical metric maybe reduced. In addition, at least the one parameter of the processmodule may be altered using a feedback control technique, a feedforwardcontrol technique, an in situ control technique, or any combinationthereof. At least the one parameter of the process module may also bealtered such that a first portion of the wafer can be processed with afirst set of process conditions during the step and such that a secondportion of the wafer can be processed with a second set of processconditions during the step.

The system may also include a controller computer coupled to at leastthe one measurement device and the process module. The controllercomputer may be configured to receive at least one measured property ofthe resist from the measurement device. The controller computer may alsobe configured to alter at least one parameter of the process module inresponse to at least the one measured property.

A further embodiment relates to a method for fabricating a semiconductordevice. For example, the method may include measuring at least oneproperty of a resist disposed upon a wafer during a lithography process.The method may also include altering at least one parameter of at leastone process module in response to at least the one measured property ofthe resist to reduce within wafer variation of a critical metric of thelithography process. In addition, the method may include processing thewafer to form at least a portion of at least one semiconductor deviceupon the wafer. For example, processing the wafer may include etching,ion implantation, deposition, chemical mechanical polishing, or plating.In this manner, semiconductor devices formed by the method may havehigher performance bin distributions thereby improving not only yieldbut also high margin product yield.

BRIEF DESCRIPTION OF THE DRAWINGS

Further advantages of the present invention may become apparent to thoseskilled in the art with the benefit of the following detaileddescription of the preferred embodiments and upon reference to theaccompanying drawings in which:

FIG. 1 depicts a flow chart illustrating a method for evaluating andcontrolling a lithography process; and

FIG. 2 depicts a plan view of a bake plate of a post exposure bakeprocess module having a number of discrete secondary heating elements inaddition to an overall primary heating element.

While the invention is susceptible to various modifications andalternative forms, specific embodiments thereof are shown by way ofexample in the drawings and may herein be described in detail. Thedrawings may not be to scale. It should be understood, however, that thedrawings and detailed description thereto are not intended to limit theinvention to the particular form disclosed, but on the contrary, theintention is to cover all modifications, equivalents and alternativesfalling within the spirit and scope of the present invention as definedby the appended claims.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Turning now to the drawings, FIG. 1 illustrates an embodiment of amethod to evaluate and control performance characteristics of alithography process. For example, the method may be used to reduce, andeven to minimize, within wafer (“WIW”) variability of critical metricsof the lithography process. Critical metrics of a lithography processmay include, but are not limited to, critical dimensions of featuresformed by the lithography process and overlay. Critical dimensions offeatures formed during the lithography process may include, for example,a width, a height, and a sidewall profile of the features. A sidewallprofile of a feature may be described, for example, by a sidewall angleof the feature with respect to an upper surface of a wafer, a roughnessof the sidewall of the feature, and other physical characteristics ofthe feature. Overlay generally refers to a lateral position of a featureon one level of a wafer with respect to a lateral position of a featureon another level of the wafer. The lithography process may includeoptical lithography, e-beam lithography, or x-ray lithography.

A lithography cluster tool, or a lithography track, may include a set ofprocess modules. An example of a lithography cluster tool is illustratedin U.S. Pat. No. 5,968,691 to Yoshioka et al., and is incorporated byreference as if fully set forth herein. The lithography cluster tool maybe coupled to an exposure tool. A first portion of the process modulesmay be configured to perform at least one step of the lithographyprocess prior to exposure of the resist. A second portion of the processmodules may be configured to perform process steps of the lithographyprocess subsequent to exposure of the resist. The lithography clustertool may also include at least one robotic wafer handler. The roboticwafer handler may move wafers from module to module. The robotic waferhandler may also be used to move wafers from the lithography clustertool to the exposure tool.

As shown in step 10, the robotic wafer handler may pick up a wafer froma cassette, which may be loaded into the lithography cluster tool by anoperator. The cassette may contain a number of wafers which may beprocessed during the lithography process. The wafers may be bare siliconwafers. Alternatively, the wafers may have been processed prior to thelithography process. For example, topographical features may have beenformed on the wafers. The topographical features may include trenches,vias, lines, etc. In addition, one or more layers of a material such asa dielectric material may have been formed on the wafers prior to thelithography process.

The wafer may be placed in a process module such as a surfacepreparation chamber, as shown in step 12. The surface preparationchamber may be configured to form a layer of an adhesion promotingchemical such as hexamethyldisilazane (“HMDS”) onto the surface of thewafer. HMDS may be deposited at a temperature of approximately 80° C. toapproximately 180° C. Therefore, after the surface preparation process,the robotic wafer handler may remove the wafer from the surfacepreparation chamber and may place the wafer into a chill module, asshown in step 14. As such, a wafer may be lowered to a temperaturesuitable for subsequent processing (e.g., approximately 20° C. toapproximately 25° C.).

In an additional embodiment, an anti-reflective coating may also beformed on the surface of the wafer. The anti-reflective coating may beformed on the wafer, for example, by spin coating followed by a postapply bake process. Since a post apply bake process for ananti-reflective coating generally involves heating a coated wafer to atemperature of approximately 175° C. to approximately 230° C., a chillprocess may also be performed subsequent to the post apply bake process.

A resist may be formed upon the wafer, as shown in step 16. For example,the wafer may be placed into a resist apply process module. A resist maybe automatically dispensed onto an upper surface of the wafer. Theresist may be uniformly distributed across the wafer by spinning thewafer at a high rate of speed such as about 2000 rpm to about 4000 rpm.The spinning process may adequately dry the resist such that the wafermay be removed from the resist apply module without affecting the coatedresist. As shown in step 18, the resist-coated wafer may be heated in apost apply bake process. The post apply bake process may include heatingthe resist-coated wafer at a temperature of approximately 90° C. toapproximately 140° C. The post apply bake process may be used to driveexcess solvent out of the resist and to alter a property of an uppersurface of the resist such as surface tension. Subsequent to the postapply bake process, the wafer may be chilled at a temperature ofapproximately 20° C. to approximately 25° C., as shown in step 20.

The method may also include measuring a property of the resist formedupon the wafer subsequent to chilling. As shown in step 22, for example,the wafer may be moved to a measurement device, or a within wafer filmmeasurement device, subsequent to chilling after the post apply bakestep. Alternatively, the wafer may remain in the chill module duringmeasurement if, for example, the measurement device is coupled to thechill module. The measurement device may be any device configured to usean optical technique to measure at least one property of the resist. Themeasurement device may also be configured to measure at least oneproperty of the resist at more than one position on the wafer. Theoptical technique may include, but is not limited to, scatterometry,interferometry, reflectometry, spectroscopic ellipsometry orspectroscopic reflectometry. Additionally, other optical measurementdevices may also be used to measure a property of the resist. Examplesof measurement devices which may be used are illustrated in U.S. Pat.No. 4,999,014 to Gold et al., U.S. Pat. No. 5,042,951 to Gold et al.,U.S. Pat. No. 5,412,473 to Rosencwaig et al., U.S. Pat. No. 5,516,608 toHobbs et al., U.S. Pat. No. 5,581,350 to Chen et al., U.S. Pat. No.5,596,406 to Rosencwaig et al., U.S. Pat. No. 5,596,411 to Fanton etal., U.S. Pat. No. 5,608,526 to Piwonka-Corle et al., U.S. Pat. No.5,747,813 to Norton et al., U.S. Pat. No. 5,771,094 to Carter et al.,U.S. Pat. No. 5,798,837 to Aspnes et al., U.S. Pat. No. 5,859,424 toNorton et al., U.S. Pat. No. 5,877,859 to Aspnes et al., U.S. Pat. No.5,889,593 to Bareket et al., U.S. Pat. No. 5,900,939 to Aspnes et al.,5,910,842 to Piwonka-Corle et al., U.S. Pat. No. 5,917,588 to Addiego,U.S. Pat. No. 5,917,594 to Norton, U.S. Pat. No. 5,973,787 to Aspnes etal., and U.S. Pat. No. 5,991,699 to Kulkarni, et al. and areincorporated by reference as if fully set forth herein. Additionalexamples of measurement devices are illustrated in PCT Application No.WO 99/02970 to Rosencwaig et al. and PCT Application No. WO 99/45340 toXu et al., and are incorporated by reference as if fully set forthherein.

The measurement device may measure at least one property of the resist.In addition, the measurement device may measure several properties ofthe resist substantially simultaneously. A property of the resistmeasured subsequent to a post apply bake process may include, but is notlimited to, a thickness, an index of refraction, or an extinctioncoefficient of the resist. The measured property may be sent to acontroller computer, or a within wafer film controller, as shown in step24. The controller computer may be coupled to the measurement device.The controller computer may determine a parameter of a process step ofthe lithography process in response to the measured property of theresist. For example, the controller computer may determine a parameterof a process step as a function of the resist using an experimentallydetermined or numerically simulated relationship. The controllercomputer may also be coupled to at least one process module of thelithography cluster tool. In this manner, the controller computer may beconfigured to alter a parameter of a process module of a lithographycluster tool. Therefore, the controller computer may control theoperation of any of the process modules included in the lithographycluster tool. Alternatively, a parameter of a process module may bealtered manually by an operator in response to output from themeasurement device or the controller computer.

In an embodiment, a feedforward control technique may be used to alter aparameter of a process module. For example, an operator or a controllercomputer may determine at least one parameter of a process module thatmay be used to perform an additional lithography process step on themeasured resist. Additional lithography process steps may includeexposure and post exposure bake. In this manner, the property of theresist may be used to alter a parameter of a process module configuredto perform an exposure step or a post exposure bake step. For example, athickness, an index of refraction, and/or an extinction coefficient ofthe resist measured subsequent to the chilling process may be used todetermine an exposure dose of an exposure process or a temperature ofthe post exposure bake process. An operator or the controller computermay alter at least one parameter of the exposure process module or thepost exposure bake process module in response to the determined exposuredose or temperature, respectively.

In addition, because at least one property of the resist may be measuredat various positions across the wafer, at least one parameter may bedetermined for each of the various positions. As such, a parameter of aprocess module may also be altered, as described above, independentlyfrom field to field on the wafer. For example, process conditions suchas exposure dose and/or post exposure bake temperature may vary acrossthe wafer in subsequent processes in response to variations in at leastone measured property from field to field across the wafer. In thismanner, critical metrics of the lithography process may be substantiallyuniform across the wafer.

In an additional embodiment, a feedback control technique may be used toalter a parameter of a process module. In this manner, a parameter of atleast one process module that may have been used to form the resist maybe altered prior to or during processes to form resist on additionalwafers. Additional wafers may include a wafer included in the same lotas the measured wafer or a wafer included in a different lot than themeasured wafer. Such a parameter may be determined in response to atleast the one measured property of the resist as described above. Forexample, the property of the resist may be used to alter a parameter ofthe resist apply process module or the post apply bake process moduleprior to and/or during processing of additional wafers.

As shown in step 26, the wafer may be transferred to an exposure processmodule. The exposure process module may perform a number of operationsthat may include, but are not limited to, aligning a wafer and exposingthe resist in a predetermined pattern. For example, the exposure processmodule may include any stepper or scanner known in the art. Exposing theresist may also include exposing the resist to a specific intensity oflight, or an exposure dose, and a specific focus condition. Manyexposure process modules may be configured such that the exposure doseand focus conditions of the expose process may be varied across thewafer, for example, from field to field. The exposure dose and focusconditions may be determined and/or altered as described herein using afeedback or feedforward control technique.

As shown in step 28, an optional process step in the lithography processmay include an edge exposure step. The edge exposure step may includeexposing resist disposed proximate an outer edge of the wafer to a lightsource to remove the resist at the outer edge of the wafer. Such removalof the resist at the outer edge of a wafer may reduce contamination ofprocess chambers and devices used in subsequent processes.

As shown in step 30, the wafer may be subjected to a post exposure bakeprocess step. The post exposure bake process may be used to drive achemical reaction in exposed portions of the resist such that portionsof the resist may be removed in subsequent processing. As such, theperformance of the post exposure bake process may be critical to theperformance of the lithography process. The post exposure bake processmay include heating the wafer to a temperature of approximately 90° C.to approximately 150° C. As shown in step 32, a measurement device, or awithin wafer critical dimension measurement device, may be coupled tothe post exposure bake process module. In this manner, a property of theresist may be measured during the post exposure bake process. Themeasurement device may use an optical technique to measure a property ofthe resist such as thickness, linewidth of a latent image, height of alatent image, index of refraction, or extinction coefficient. Themeasurement device may be configured to use a technique such asscatterometry, interferometry, reflectometry, spectroscopicellipsometry, and spectroscopic reflectometry. Additional examples ofmeasurement devices may include any of the measurement devices asdescribed herein. Therefore, the measured property of the resist may beused to evaluate and control the post exposure bake process using an insitu control technique. For example, the measurement device may measurea property of the resist during the post exposure bake process, and aparameter of the post exposure bake process module may be altered inresponse to the measured property during the process.

In addition, the measurement device may be used to measure a property ofthe resist at various times during a post exposure bake process. Assuch, the measurement device may monitor variations in at least oneproperty of the resist over time. In this manner, a signaturecharacteristic of an endpoint of the post exposure bake process may bedetermined, and at which time, the process may be ended. Monitoringvariations in at least one property of the resist during the postexposure bake process may also be enhanced by measuring at least oneproperty of the resist at multiple positions on the wafer.

The measurement device may be configured to measure a property of theresist at multiple positions within a field and at multiple positionswithin at least two fields on the wafer during the post exposure bakeprocess. In this manner, at least one parameter of the process modulemay be determined at various positions across the wafer. As such, aparameter of the post exposure bake module may be altered independentlyas described above from field to field on the wafer. For example, atemperature of a bake plate of the post exposure bake process module mayvary across the bake plate during the post exposure bake process inresponse to variations in at least one measurement property of theresist from field to field across the wafer. Therefore, within wafervariations of critical parameters may be reduced, or even minimized.

As shown in FIG. 2, a temperature of the post exposure bake plate may bealtered across the bake plate by using a number of discrete secondaryheating elements 48 disposed within primary heating element 50.Secondary heating elements 48 and primary heating element 50 may includeresistive heating elements or any other heat source known in the art.Secondary heating elements 48 may be independently controlled, forexample, by altering an electrical current supplied to each of thesecondary heating elements to alter a temperature profile of primaryheating element 50. As such, a temperature profile across a wafer duringa post exposure bake process may be altered such that individual fieldson a wafer may be heated at substantially the same temperature or atindividually determined temperatures. In this manner, a uniformity ofcritical metrics of a lithography process across a wafer may beincreased.

Referring to FIG. 1 again, as shown in step 34, subsequent to the postexposure bake process, the wafer may be chilled. Subsequent to chilling,the wafer may be moved to a measurement device. Alternatively, the wafermay remain in the chill module during measurement if, for example, themeasurement device is coupled to the chill module. The measurementdevice may be configured as any measurement device as described herein.The measurement device may measure at least one property of the resist.In addition, the measurement device may measure several properties ofthe resist substantially simultaneously. A property of the resistmeasured subsequent to or during the chill process may include, but isnot limited to, a thickness, a linewidth of a latent image, a height ofa latent image, an index of refraction, or an extinction coefficient.The measured property of the resist may be used to alter a parameter ofa process module of the lithography cluster tool using a feedbackcontrol technique or a feedforward control technique. For example, themeasured property of the resist may be used to alter an exposure dose ora post exposure bake temperature using a feedback control technique orto alter a develop time using a feedforward control technique.

The measurement device may be configured to measure a property of theresist at multiple positions within a field and at multiple positionswithin at least two fields on the wafer subsequent to or during thechill process. In this manner, at least one parameter of a processmodule of a lithography cluster tool may be determined at variouspositions across the wafer. As such, a parameter of an exposure processmodule, a post exposure bake process module, or a develop process modulemay be altered independently as described above from field to field onthe wafer. For example, a temperature of a bake plate of the postexposure bake process module may vary across the bake plate in responseto variations in at least one measurement property of the resist fromfield to field across the wafer. As described above, therefore, withinwafer variations of critical parameters may be reduced, or evenminimized.

As shown in step 36, subsequent to the post exposure process, the wafermay be subjected to a develop process step. The develop process step maybe configured to remove a portion of the resist. For example, a developprocess may include dispensing an aqueous developer solution on a wafersubsequent to a post exposure bake process and rinsing the wafer withde-ionized water. Resist remaining after the develop process step maydefine a pattern formed in the original resist layer. The formed patternmay include an arrangement of lines, spaces, trenches, and/or vias.Subsequent to the develop process, as shown in step 38, a measurementdevice, or a within wafer critical dimension measurement device, may beused to measure a property of the resist such as, but not limited to, athickness, an index of refraction, or an extinction coefficient of theremaining resist, a width, a height, or a sidewall profile of a feature,or overlay. The measured property may be sent to a controller computer,or within wafer critical metric controller, as shown in step 46.

A parameter of a process module involved in the lithography process maybe altered in response to the measured property using a feedback controltechnique. For example, the altered parameter of the process module maybe a function of the measured property of the resist. The feedbackcontrol technique may include, for example, measuring a linewidth offeatures formed in the resist subsequent to the develop process step andaltering a parameter of an expose process module or a post exposure bakeprocess module, which may be used to fabricate additional wafers. Inaddition, a linewidth of features formed in the resist may be measuredat various positions across the wafer subsequent to the develop processstep. In this manner, parameters of an expose process module may bealtered at the field level in response to the measured properties of theresist by altering parameters of the expose process step such as theexposure dose and the exposure focus conditions at each field. As such,the controller computer may provide a two-dimensional array of exposuredoses and/or exposure focus conditions to the exposure process module inresponse to the measured property of the resist. Therefore, variationsin within wafer critical metrics of the lithography process may bereduced, or even minimized.

As shown in step 40, subsequent to measuring a property of the resist, ahard bake, or post develop bake, process step may be performed. The hardbake process may be used to drive contaminants and any excess water fromthe resist. Therefore, the hard bake process may include heating thewafer at a temperature of approximately 90° C. to approximately 130° C.As shown in step 42, the temperature of the wafer may then be reduced byusing a wafer chill process. Subsequent to the wafer chill process ofstep 42, an additional measurement of at least one property of theresist may be performed as described herein, as shown in step 44. Themeasurement device may be configured as described in any of the aboveembodiments. This measurement may also be used to alter a parameter of aprocess module using a feedback control technique as described herein.For example, at least one measured property of a resist may be sent to acontroller computer, or a within wafer critical dimension controller, asshown in step 48.

It is to be understood that all of the measurements described above maybe used to alter a parameter of a lithography process module using afeedback, a feedforward, or an in situ process control technique. Inaddition, within wafer variations of critical metrics of a lithographyprocess may be further reduced by using a combination of the abovetechniques. The method may also include measurements at additionalpoints in a lithography process such as measuring at least one propertyof an anti-reflective coating subsequent to forming the anti-reflectivecoating on a wafer. The property of the anti-reflective coating may beused to alter a parameter of a process module using a feedback controltechnique, a feedforward control technique, or an in situ controltechnique as described herein.

In an additional embodiment, a system configured to evaluate and controla lithography process may include at least one measurement device and atleast one process module. The system may be configured to reduce, andeven to minimize, within wafer variability of at least one criticalmetric of the lithography process. Critical metrics of a lithographyprocess include, but are not limited to, critical dimensions of featuresformed by the lithography process and overlay as described above.

A measurement device may be configured to measure at least one propertyof a resist disposed upon a wafer during the lithography process. Asshown in FIG. 1, for example, a measurement device may include withinwafer film measurement device 22, within wafer critical dimensionmeasurement device 32, within wafer critical dimension measurementdevice 38, and/or within wafer critical dimension measurement device 44.Such measurement devices may be configured as described herein. Inaddition, the system may include additional measurement devices asdescribed herein. The measurement device may be configured to measurethe property of the resist during any of the process steps as describedabove or subsequent to any of the process steps as described above.

In an embodiment, therefore, the measurement device may be coupled to atleast one of the process modules such that the measurement device mayperform an in situ measurement of a resist. Alternatively, themeasurement device may be disposed within a lithography cluster toolsuch that the measurement device may perform a measurement of a resistbetween two process steps. In this manner, a method as described hereinmay have a quicker turn around time than conventional lithographyprocess control methods. As described herein, at least the one measuredproperty may include a thickness, an index of refraction, an extinctioncoefficient, a linewidth of a latent image, a height of a latent image,a width of a feature, a height of a feature, a sidewall profile of afeature, overlay, or any combination thereof. At least the onemeasurement device may also be configured to measure at least the oneproperty of the resist at various locations across the wafer. Forexample, a thickness of the resist may be measured at various positionsor fields across the wafer. In addition, a property of the resist may bemeasured at various positions within a field of the wafer or at variouspositions within several fields of the wafer.

A process module may be configured to perform a step of the lithographyprocess. As shown in FIG. 1, for example, such process modules mayinclude, but are not limited to, surface preparation chamber 12, resistapply process module 16, post apply bake process module 18, exposureprocess module 26, post exposure bake process module 30, develop processmodule 36, and hard bake process module 40. At least one parameter ofthe process module may be altered in response to at least the onemeasured property such that within wafer variation of the criticalmetric can be reduced, or even minimized. For example, at least oneparameter of a process module may be altered using a feedback controltechnique, a feedforward control technique, an in situ controltechnique, or any combination thereof.

In addition, at least the one parameter of the process module may bealtered such that a first portion of the wafer may be processed with afirst set of process conditions during a step of the lithography processand such that a second portion of the wafer may be processed with asecond set of process conditions during the step. For example, eachportion of the wafer may be a field of the wafer. In this manner, eachfield of the wafer may be subjected to different process conditions suchas, but not limited to, exposure dose and focus conditions and postexposure bake temperatures. As such, because each field of a wafer maybe subjected to process conditions that may vary depending upon ameasured property of a resist formed upon the wafer, within wafervariations in critical metrics of the lithography process may besubstantially reduced, or even minimized.

The system may also include a controller computer coupled to at leastone measurement device and to at least one process module. As shown inFIG. 1, for example, a controller computer may include within wafer filmcontroller 24 and within wafer critical dimension controller 46. Thecontroller computer may include any appropriate controller device knownin the art. The controller computer may be configured to receive atleast one measured property of the resist from the measurement device.In addition, the controller computer may be configured to determine atleast one parameter of a process module in response to the measuredproperty of the resist. For example, the controller computer may beconfigured to use an experimentally determined or a numericallysimulated relationship between the property and the parameter todetermine a parameter in response to the property. The controllercomputer may be further configured to control the process module suchthat the parameter may be altered in response to the determinedparameter. Therefore, the altered parameter of the process step may be afunction of at least one measured property of the resist. The controllercomputer may also be configured to control the measurement device tomeasure the physical property of the resist.

In an additional embodiment, the system may be configured to monitorvariations in at least one property of the resist. For example, ameasurement device may be configured to measure a property of the resistsubstantially continuously or at predetermined time intervals during astep of the lithography process. A controller computer coupled to thesystem may, therefore, receive the measured property from themeasurement device and may monitor variations in the property over theduration of a process step of the lithography process. By analyzing thevariations in at least one property of the resist during a step of thelithography process, the controller computer may also generate asignature representative of a process step such as a post exposure bakeprocess. The signature may include at least one singularity which may becharacteristic of an endpoint of the post exposure bake process. Anappropriate endpoint for the process step may be a linewidth or athickness of a latent image in the resist formed during the postexposure bake process. The linewidth or the thickness of the latentimage may be larger or smaller depending upon the semiconductor devicefeature being fabricated by the lithography process. After thecontroller computer may have detected the singularity of the signature,the controller computer may stop the post exposure bake process byaltering a level of a parameter of an instrument coupled to the postexposure bake process module.

In an embodiment, a method for fabricating a semiconductor device mayinclude a lithography process in which a pattern may be transferred froma reticle to a resist. For example, portions of the resist may beremoved using a lithography process such that regions of the wafer or anunderlying layer may be exposed to a subsequent process such as an ionimplantation process. The predetermined regions may be regions of thewafer or the underlying layer in which features of a semiconductordevice are to be formed such as, for example, source/drain junctions.Fabricating a semiconductor device may also include evaluating andcontrolling a lithography process by measuring at least one property ofa resist disposed upon a wafer during the lithography process. Inaddition, measuring at least one property of the resist may includemeasuring within wafer variations in at least one property of the resistduring the lithography process. The physical property of the resist maybe altered by a process step of the lithography process.

The method for fabricating a semiconductor device may also includedetermining and/or altering at least one parameter of a process modulewhich may be configured to perform a step of the lithography process.The altered parameter may be determined in response to at least onemeasured property of the resist to reduce within wafer variations of acritical metric of the lithography process. For example, the alteredparameter may be determined using a function which describes arelationship between the physical property of the resist and a parameterof the process step of the lithography process. The altered parametermay also be determined independently at various positions within a fieldor within several fields of the wafer. In this manner, semiconductordevices fabricated by the method may have higher performance bindistributions thereby improving not only yield but also high marginproduct yield. In addition, the method for fabricating a semiconductordevice may include processing a wafer to form at least a portion of atleast one semiconductor device upon the wafer. For example, processingthe wafer may include at least one semiconductor fabrication processsuch as etching, ion implantation, deposition, chemical mechanicalpolishing, plating, and/or any other semiconductor fabrication processknown in the art.

A set of data may be collected and analyzed that may used to determine aparameter of a process module in response to a measured property of aresist formed upon a wafer. Process control methods as described hereinmay also be used to further optimize a lithography process by usingoptical measurements as described herein in conjunction with electricalmeasurements of a semiconductor device that may be formed with thelithography process. The combination of optical and electricalmeasurements may provide a larger amount of characterization data for alithography process. In this manner, the characterization data may beused to understand the mechanisms of lithography, to pin-point the causeof defects, and to make accurate adjustments to parameters of variousprocess modules, or the process conditions. In addition, such a processcontrol strategy may be used to qualify, or characterize the performanceof, a new lithography tool. The process control method may also be usedto compare the performance of several similar lithography tools. Such acomparison may be used, for example, in a manufacturing environment inwhich several tools may be used in parallel to manufacture one device orproduct. Furthermore, this process control strategy may be used todetermine an appropriate resist and thickness in the development stagesof defining a lithography process.

In an embodiment, a quantitative relationship may be developed between aparameter of a process module that may be varied and a property of aresist. For example, a number of wafers may be processed usingvariations of a parameter of the process module. All other parameters ofthe process module and additional process modules may remain constant,and a correlation between the varied parameter and a property of theresist may be developed. In this manner, an algorithm that describes thequantitative relationship between each of the process parameters for aprocess module and the measured property of the resist may bedetermined. The developed algorithms may be used during processing ofproduct wafers to determine if the process is operating within designtolerance for a process and a process module. Additionally, algorithmsmay be developed and used to further optimize a current process, tocharacterize a new process module, or to develop processes to fabricatenext generation devices.

Furthermore, this algorithm may be integrated into a controller for ameasurement device or a process module. The controller may by a computersystem configured to operate software to control the operation of ameasurement device such as a scatterometer, an interferometer, areflectometer, a spectroscopic ellipsometer, or a spectroscopicreflectometer. The computer system may include a memory medium on whichcomputer programs for operating the device and performing calculationsrelated to the collected data. The term “memory medium” is intended toinclude an installation medium, e.g., a CD-ROM, or floppy disks, acomputer system memory such as DRAM, SRAM, EDO RAM, Rambus RAM, etc., ora non-volatile memory such as a magnetic media, e.g., a hard drive, oroptical storage. The memory medium may include other types of memory aswell, or combinations thereof. In addition, the memory medium may belocated in a first computer in which the programs are executed, or maybe located in a second different computer that connects to the firstcomputer over a network. In the latter instance, the second computerprovides the program instructions to the first computer for execution.Also, the computer system may take various forms, including a personalcomputer system, mainframe computer system, workstation, networkappliance, Internet appliance, personal digital assistant (PDA),television system or other device. In general, the term “computersystem” may be broadly defined to encompass any device having aprocessor which executes instructions from a memory medium.

The memory medium preferably stores a software program for the operationof a measurement device and/or a process module. The software programmay be implemented in any of various ways, including procedure-basedtechniques, component-based techniques, and/or object-orientedtechniques, among others. For example, the software program may beimplemented using ActiveX controls, C++ objects, JavaBeans, MicrosoftFoundation Classes (MFC), or other technologies or methodologies, asdesired. A CPU, such as the host CPU, executing code and data from thememory medium includes a means for creating and executing the softwareprogram according to the methods described above.

Various embodiments further include receiving or storing instructionsand/or data implemented in accordance with the foregoing descriptionupon a carrier medium. Suitable carrier media include memory media orstorage media such as magnetic or optical media, e.g., disk or CD-ROM,as well as signals such as electrical, electromagnetic, or digitalsignals, conveyed via a communication medium such as networks and/or awireless link.

The software for a measurement device may then be used to monitor andpredict the processing conditions of subsequent lithography processes.Preferably, the predefined algorithm for a process step of thelithography process may be incorporated into the software package thatinterfaces with the measurement device. In this manner, the software maybe configured to receive data that may be measured by the measurementdevice. The software may also be configured to perform appropriatecalculations to convert the data into properties of the resist.Additionally, the software may also be configured to compare a propertyof a resist formed on a product wafer to a property of a resist formedon a reference wafer for a lithography process. In this manner, thesoftware may be configured to convert variations in the properties tovariations that may occur in the process conditions. Furthermore, byincorporation of the appropriate algorithm, the software may also beconfigured to convert the properties of a resist into meaningful dataabout the process conditions of the lithography process including acharacteristic of an exposure step or a characteristic of a postexposure bake step.

A method to evaluate and control a lithography process using field levelanalysis as described above may provide dramatic improvements overcurrent process control methods. Measuring within wafer variability ofcritical metrics, or critical dimensions, may provide tighter control ofthe critical dimension distribution. In addition to improving themanufacturing yield, therefore, the method described above may alsoenable a manufacturing process to locate the distribution performance ofmanufactured devices closer to a higher performance level. As such, thehigh margin product yield may also be improved by using such a method toevaluate and control a lithography process. Furthermore, additionalvariations in the lithography process may also be minimized. Forexample, a process may use two different post exposure bake units toprocess one lot of wafers. Two bake units may be used to perform thesame process such that two wafers may be processed simultaneously inorder to reduce the overall processing time. Therefore, the above methodmay be used to evaluate and control each bake unit separately. As such,the overall process spread may also be reduced.

The data gathered in accordance with the present invention may beanalyzed, organized and displayed by any suitable means. For example,the data could be grouped across the wafer as a continuous function ofradius, binned by radial range, binned by stepper field, by x-y position(or range of x-y positions, such as on a grid), by nearest die, and/orother suitable methods. The variation in data may be reported bystandard deviation from a mean value, the range of values, and/or anyother suitable statistical method.

The extent of the within wafer variation (such as the range, standarddeviation, and the like) may be analyzed as a function of wafer, lotand/or process conditions. For example, the within wafer standarddeviation of the measured CD may be analyzed for variation from lot tolot, wafer to wafer, and the like. It may also be grouped, reportedand/or analyzed as a function of variation in one or more processconditions, such as develop time, photolithographic exposure conditions,resist thickness, post exposure bake time and/or temperature,pre-exposure bake time and/or temperature, and the like. It may also orinstead be grouped, reported and/or analyzed as a function of withinwafer variation in one or more of such processing conditions.

The data gathered in accordance the present invention may be used notjust to better control process conditions, but also where desirable tobetter control in situ endpointing and/or process control techniques.For example, data gathered in accordance the present invention may beused in conjunction with an apparatus such as that set forth in U.S.Pat. No. 5,689,614 to Gronet et al. and/or Published European patentApplication No. EP 1066925 A2 to Zuniga et al., which are herebyincorporated by reference as if fully set forth herein, to improve thecontrol over localized heating of the substrate or closed loop controlalgorithms. Within wafer variation data could be fed forward or back tosuch a tool to optimize the algorithms used in control of local waferheating or polishing, or even to optimize the tool design. In anotherexample of such localized process control, within wafer variation datacould be used to control or optimize a process or tool such as that setforth in one or more of Published PCT Patent Application Nos. WO99/41434 to Wang or WO 99/25004 to Sasson et al. and/or PublishedEuropean Patent Application No. 1065567 A2 to Su, which are herebyincorporated by reference as if fully set forth herein. Again, withinwafer variation data taken, for example from stand alone and/orintegrated measurement tools, could be used to better control and/oroptimize the algorithms, process parameters and integrated processcontrol apparatuses and methods in such tools or processes. Dataregarding metal thickness and its within wafer variation could bederived from an x-ray reflectance tool such as that disclosed in U.S.Pat. No. 5,619,548 to Koppel and/or Published PCT Application No. WO01/09566 to Rosencwaig et al., which are hereby incorporated byreference as if fully set forth herein, by eddy current measurements, bye-beam induced x-ray analysis, or by any other suitable method.

Further modifications and alternative embodiments of various aspects ofthe invention may be apparent to those skilled in the art in view ofthis description. For example, methods and systems for lithographyprocess control are provided. Accordingly, this description is to beconstrued as illustrative only and is for the purpose of teaching thoseskilled in the art the general manner of carrying out the invention. Itis to be understood that the forms of the invention shown and describedherein are to be taken as the presently preferred embodiments. Elementsand materials may be substituted for those illustrated and describedherein, parts and processes may be reversed, and certain features of theinvention may be utilized independently, all as would be apparent to oneskilled in the art after having the benefit of this description of theinvention. Changes may be made in the elements described herein withoutdeparting from the spirit and scope of the invention as described in thefollowing claims.

1. A wafer measurement system for use within a wafer process tool,comprising: a wafer handler associated with the wafer process tool forfeeding wafers between a cassette and any one or more of a plurality ofstations of the wafer process tool; a wafer measurement station formingone of the stations of the wafer process tool, the measurement stationhaving a wafer support in communication with the wafer handler, themeasurement station also having therein an optical measurement systemforming a scatterometry instrument that is moveable by a stage tospecified locations over the wafer support, the optical measurementsystem optically coupled to a light source to direct a light beam as aspot onto patterned features of a wafer surface on the wafer support,wherein the light beam is characterized by a spot size that is larger atthe wafer surface than a periodicity of the patterned features, theoptical measurement system also having a light collector associated witha detector whereby illuminated features on the wafer surface yieldcharacteristic optical signatures with independent optical parameters inthe signatures including one or more of wavelength, incidence angle, andaltitude and azimuthal collection angles; and a data processor analyzingthe characteristic signatures of a wafer using a scattering model forpossible periodic strictures on the wafer to obtain a measure of thepatterned features on the wafer so that a process carried out by thewafer process tool can be analyzed, and altering at least one parameterof at least one of the plurality of the stations in response to themeasure of the patterned features such that a first portion of the waferis processed with a first set of process conditions during a step of theprocess and such that a second portion of the wafer is processed with asecond set of process conditions during the step, wherein the first setis different than the second set.
 2. The system of claim 1, wherein theoptical measurement system includes an objective lens imaging light fromthe spot on the wafer.
 3. The system of claim 1, wherein the waferhandler feeds the wafers into the wafer measurement station with aunspecified wafer orientation relative to the optical measurementsystem.
 4. The system of claim 1, wherein the measure of the patternedfeatures obtained by the data processor includes at least one dimensionof lateral or vertical geometric structure of the patterned features onthe wafer.
 5. The system of claim 4, wherein the measure of thepatterned features include line width and profile of the patternedfeatures on the wafer.
 6. The system of claim 1, further comprising anx-y stage driving the optical measurement system, the wafer supportholding the wafer stationary within the wafer measurement station. 7.The system of claim 1, wherein the wafer support is capable of movingthe wafer in at least one dimension.
 8. The system of claim 7, whereinthe wafer support is rotatable to any of a plurality of angularorientations (q) of the patterned features relative to the opticalmeasurement system without (x,y) translation of the wafer, and a linearstage drives the optical measurement system relative to a radialposition (r) of the wafer.
 9. The system of claim 7, wherein the wafersupport is tiltable to any of a plurality of incidence angles of saidbeam onto said wafer surface.
 10. The system of claim 1, wherein thewafer support comprises a vacuum chuck.
 11. A scatterometry instrumentintegrated within a wafer measurement station that forms one station ofa wafer process tool, the process tool having a wafer handler associatedtherewith feeding wafers between a cassette and one or more of aplurality of stations of the process tool, the wafer measurement stationhaving, in addition to the scatterometry instrument, a wafer supportwith a capacity for locating a wafer at a measurement position, whereinthe scatterometry instrument comprises: a movable stage; an opticalmeasurement system mounted on said stage for movement by said stage toone or more specified locations over the wafer held by stationary ormovable the wafer support in the measurement position, the wafer supportbeing stationary or movable, the measurement system being in opticalcommunication with a light source for directing a light beam as a spotonto patterned features of the wafer, wherein the light beam ischaracterized by a spot size that is larger at the wafer surface of thewafer than a periodicity of the patterned features, the measurementsystem having collection optics associated with a detector forcollecting and detecting light scattered from the surface of the waferilluminated by the light beam, whereby the patterned features on thewafer yield characteristic optical signatures with independent opticalparameters of the signatures including one or more of wavelength,incidence angle, and altitude and azimuthal collection angles; and adata processor in communication with the detector, the data processoranalyzing the characteristic optical signatures using a scattering modelfor possible periodic structures on the wafer to obtain a measure of thepatterned features on the wafer such that a process carried out by thewafer process tool can be analyzed, and altering at least one parameterof at least one of the plurality of the stations response to the measureof the patterned features such that a first portion of the wafer isprocessed with a first set of process conditions during a step of theprocess and such that a second portion of the wafer is processed with asecond set of process conditions during the step, wherein the first setis different than the second set.
 12. The instrument of claim 11,wherein the collection optics of the measurement system includes anobjective lens positioned to image light scattered from the spot on thewafer.
 13. The instrument of claim 11 wherein the wafer handler of theprocess tool and the wafer support in the wafer measurement stationprovide an unspecified wafer orientation relative to the opticalmeasurement system.
 14. The Instrument of claim 11, wherein the measureof the patterned features obtained by the data processor includes atleast one dimension of lateral or vertical geometric structure of thepatterned features on the wafer.
 15. The instrument of claim 14, whereinthe measure of the patterned features include line width and profile ofthe patterned features on the wafer.
 16. A wafer measurement method forcooperative use with a wafer process tool having a wafer handlerassociated with a cassette of wafers, comprising: within the waferprocess tool after completion of any of one or more process stepscarried out in processing stations of the process tool, receiving in anintegrated measuring station of the process tool a wafer from the waferhandler associated within the process tool without first transferringwafers out of the process tool to another cassette or cassette loadingstation, and depositing the wafer at an unspecified orientation in themeasuring station relative to a moveable optical measurement system;moving the optical measurement system to a plurality of locations overthe wafer; directing a beam of light normally onto surface of the waferas a light spot at each of said plurality of locations, the light spotcharacterized by a spot size that is larger at the wafer surface than aperiodicity of pattern features on the wafer; detecting light reflectedfrom the wafer surface to obtain data for an optical characteristic ofthe pattern features on the wafer at said plurality of locations;analyzing the optical characteristic data using a scattering model ofpossible periodic structures on the wafer to obtain a measure ofcritical dimensions of the surface pattern features on the wafer; andaltering least one parameter of at least one of the processing stationsin response to the measure of the critical dimensions such that a firstportion of the wafer is processed with a first set of process conditionsduring a step of a process performed by the wafer process tool and suchthat a second portion of the wafer is processed with a second set ofprocess conditions during the step, wherein the first set is differentthan the second set.
 17. The method of claim 16, further comprisingsequentially measuring reflectance data for a plurality of wafersreceived from the wafer process tool.
 18. A method of measuring a waferwithin a wafer process tool, comprising; transforming wafer roboticallyfrom a process station of the process tool to a measurement station ofthe process tool; positioning a measurement spot of an optical head of ameasurement instrument within the measurement station over a firstlocation of the wafer; rotating the wafer and translating the opticalhead to position the measurement spot over a second location of thewafer; repeating the wafer rotation and optical head translation tosuccessively position the measurement spot over different locations ofthe wafer; measuring an optical characteristic of the wafer at each ofthe successive measurement locations; and altering at least oneparameter of an additional process station of the wafer process tool inresponse to the optical characteristic such that a first portion of thewafer is processed with a first set of process conditions during a stepof a process performed by the wafer process tool and such that a secondportion of the wafer is processed with a second set of processconditions during the step wherein the first set is different than thesecond set.
 19. A system, comprising: a lithography cluster toolcomprising a set of process modules and a robotic wafer handlerconfigured to move a wafer from a cassette loaded into the tool to oneof the process modules; a measurement device integrated into thelithography cluster tool, wherein the device is configured to use anoptical technique to measure at least one property of a pattern offeatures on the wafer, wherein the optical technique comprisesscatterometry, and wherein the at least one property can be used toevaluate a process performed on the wafer in the lithography clustertool; and a controller computer configured to alter at least oneparameter of at least one of the set of process modules in response theat least one property such that a first portion of the wafer isprocessed with a first set of process conditions during a step of theprocess and such that a second portion of the wafer is processed with asecond set of process conditions during the step, wherein the first setis different than the second set.
 20. The system of claim 19, whereinthe at least one property comprises a width or a height of at least oneof the features.
 21. The system of claim 19, wherein the at least oneproperty comprises overlay.
 22. A system, comprising: a lithographycluster tool comprising a set of process modules and a robotic waferhandler configured to move a wafer from a cassette loaded into the toolto one of the process modules; a measurement device integrated into thelithography cluster tool, wherein the device is configured to use anoptical technique to measure at least one property of a pattern offeatures on the wafer at more than one position on the wafer, whereinthe optical technique comprises scatterometry, and wherein the at leastone property can be used to evaluate a process performed on the wafer inthe lithography cluster tool; and a controller computer configured toalter at least one parameter of at least one of the set of processmodules in response to the at least one property such that a firstportion of the wafer is processed with a first set of process conditionsduring a step of the process and such that a second portion of the waferis processed with a second set of process conditions during the step,wherein the first set is different than the second set.
 23. The systemof claim 22, wherein the at least one property comprises a width or aheight of at least one of the features.
 24. A method, comprising;measuring at least one property of a pattern of features on a wafer atmore than one position on the wafer with a measurement device disposedwithin a lithography cluster tool after at least one step of alithography process has been performed on the wafer by the tool, whereinthe measurement device is configured to use an optical technique tomeasure the at least one property, wherein the optical techniquecomprises scatterometry, and wherein the at least one property comprisesa critical dimension of the pattern of features; and altering at leastone parameter of the lithography cluster tool in response to the atleast one property such that a first portion of the wafer is processedwith a first set of process conditions during the lithography processand such that a second portion of the wafer is processed with a secondset of process conditions during the lithography process, wherein thefirst set is different than the second set.
 25. The method of claim 24,further comprising measuring at least one additional property of aresist disposed upon at least two wafers during the lithography process.26. A method, comprising: moving a wafer from a process module of alithography cluster tool to a measurement device disposed within thetool with a robotic wafer handler; measuring at least one property of aresist at more than one position on the wafer with the measurementdevice; and altering at least one parameter of the lithography clustertool in response to the at least one property such than a first portionof the wafer is processed with a first set of process conditions duringa step of a process performed by the lithography cluster tool and suchthat a second portion of the wafer is processed with a second set ofprocess conditions during the step, wherein the first set is differentthan the second set.